发明名称 Ball grid array chip packages having improved testing and stacking characteristics
摘要 A stackable ball grid array (BGA) or fine ball grid array (FBGA) semiconductor package particularly suitable for board-on-chip or chip-on-board applications in which a low-profile BGA or FBGA semiconductor package is needed. The stackable ball grid array (BGA) or fine ball grid array (FBGA) provides a semiconductor package that is capable of being burned-in and tested in a more efficient and cost-effective manner than prior known BGA or FBGA semiconductor packages. A high-density, low-profile memory module incorporating a plurality of the disclosed BGA or FBGA semiconductor packages in a stacked arrangement is further disclosed.
申请公布号 US6693363(B2) 申请公布日期 2004.02.17
申请号 US20020136123 申请日期 2002.05.01
申请人 MICRON TECHNOLOGY, INC. 发明人 TAY WUU YEAN;FOOK JEFFREY TOH TUCK
分类号 G01R1/04;H01L23/31;H01L25/10;H05K1/18;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 主分类号 G01R1/04
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