发明名称 |
Ball grid array chip packages having improved testing and stacking characteristics |
摘要 |
A stackable ball grid array (BGA) or fine ball grid array (FBGA) semiconductor package particularly suitable for board-on-chip or chip-on-board applications in which a low-profile BGA or FBGA semiconductor package is needed. The stackable ball grid array (BGA) or fine ball grid array (FBGA) provides a semiconductor package that is capable of being burned-in and tested in a more efficient and cost-effective manner than prior known BGA or FBGA semiconductor packages. A high-density, low-profile memory module incorporating a plurality of the disclosed BGA or FBGA semiconductor packages in a stacked arrangement is further disclosed.
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申请公布号 |
US6693363(B2) |
申请公布日期 |
2004.02.17 |
申请号 |
US20020136123 |
申请日期 |
2002.05.01 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
TAY WUU YEAN;FOOK JEFFREY TOH TUCK |
分类号 |
G01R1/04;H01L23/31;H01L25/10;H05K1/18;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 |
主分类号 |
G01R1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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