发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device, which uses a crystalline silicon film having high crystallinity and a flat surface with few ridges and has high characteristics, and a method of manufacturing the semiconductor device are provided. According to the manufacturing method, a first amorphous silicon film is crystallized by using a heat treatment. A second amorphous silicon film is formed on a first crystalline silicon film thus obtained as an under film, and the second amorphous silicon film is crystallized by irradiation of laser light, so that a silicon film having excellent crystallinity and a surface with few ridges is obtained. The first crystalline silicon film and the second crystalline silicon film having different crystal structures are used as an active layer of a thin film transistor.
申请公布号 US6693044(B1) 申请公布日期 2004.02.17
申请号 US19990227577 申请日期 1999.01.08
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;HAYAKAWA MASAHIKO
分类号 H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L21/302 主分类号 H01L21/20
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