发明名称 Decoupling capacitance assignment technique with minimum leakage power
摘要 A method and apparatus for assigning decoupling capacitors on an integrated circuit such that leakage power is minimized is provided. Particularly, the method and apparatus use an available capacitance area of an integrated circuit, a capacitance requirement of the integrated circuit, an available thin-oxide capacitance amount, and an available thick-oxide capacitance amount to generate an assignment that indicates what percentage of the available capacitance area should be filled with thin-oxide capacitors and what percentage of the available capacitance area should be filled with thick-oxide capacitors in order to meet the capacitance requirement and minimize leakage power attributable to the thin-oxide and thick-oxide capacitors.
申请公布号 US6694493(B2) 申请公布日期 2004.02.17
申请号 US20010992515 申请日期 2001.11.14
申请人 SUN MICROSYSTEMS, INC. 发明人 BOBBA SUDHAKAR;THORP TYLER
分类号 G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F17/50
代理机构 代理人
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