发明名称 |
LASER REPAIR EQUIPMENT FOR SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: Laser repair equipment for a semiconductor device is provided to avoid a wafer slip and prevent a wafer from being broken when the wafer is loaded/unloaded into/from a chuck by having a chuck pin that includes a chuck pin body and a chuck pin cap of a great friction coefficient. CONSTITUTION: The chuck pin(220) loads/unloads the wafer into/from the chuck in a semiconductor device laser repair process during a semiconductor post process in which a redundancy cell is replaced by an electrically damaged cell of a semiconductor device on the wafer. The chuck pin body(222) is prepared. The chuck pin cap(224) supports the wafer, located in the upper portion of the chuck pin and made of a material having a friction coefficient greater than that of a material constituting the chuck pin body.
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申请公布号 |
KR20040013257(A) |
申请公布日期 |
2004.02.14 |
申请号 |
KR20020046107 |
申请日期 |
2002.08.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOO, YEONG PYO |
分类号 |
H01L21/82;(IPC1-7):H01L21/82 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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