发明名称 |
METHOD FOR FABRICATING LEVENSON TYPE PHASE SHIFT MASK |
摘要 |
PURPOSE: A method for fabricating a Levenson type phase shift mask is provided to improve the resolution by reducing the loss of an anti-reflective layer and the roughness of a surface of a substrate. CONSTITUTION: A chrome layer(21) and an anti-reflective layer(22) are deposited on a quartz substrate(20). The first photoresist pattern is formed thereon and the anti-reflective layer(22) and the chrome layer(21) are etched. The first photoresist pattern is removed and the second photoresist pattern is formed on the quartz substrate(20) and the anti-reflective layer(22). A phase shift region(25) is formed by etching the quartz substrate. The second photoresist pattern is removed and a non-phase shift region(26) is formed by etching the quartz substrate(20).
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申请公布号 |
KR20040013728(A) |
申请公布日期 |
2004.02.14 |
申请号 |
KR20020046790 |
申请日期 |
2002.08.08 |
申请人 |
PKL CO., LTD. |
发明人 |
CHOI, SANG SU;CHOI, SE JONG;JUNG, SU HONG;KIM, JIN MIN;LEE, DONG HYEOK;YOON, SI YEOL |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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