发明名称 METHOD FOR FABRICATING LEVENSON TYPE PHASE SHIFT MASK
摘要 PURPOSE: A method for fabricating a Levenson type phase shift mask is provided to improve the resolution by reducing the loss of an anti-reflective layer and the roughness of a surface of a substrate. CONSTITUTION: A chrome layer(21) and an anti-reflective layer(22) are deposited on a quartz substrate(20). The first photoresist pattern is formed thereon and the anti-reflective layer(22) and the chrome layer(21) are etched. The first photoresist pattern is removed and the second photoresist pattern is formed on the quartz substrate(20) and the anti-reflective layer(22). A phase shift region(25) is formed by etching the quartz substrate. The second photoresist pattern is removed and a non-phase shift region(26) is formed by etching the quartz substrate(20).
申请公布号 KR20040013728(A) 申请公布日期 2004.02.14
申请号 KR20020046790 申请日期 2002.08.08
申请人 PKL CO., LTD. 发明人 CHOI, SANG SU;CHOI, SE JONG;JUNG, SU HONG;KIM, JIN MIN;LEE, DONG HYEOK;YOON, SI YEOL
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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