发明名称 |
REAL-TIME INFORMATION SYSTEM OF ABNORMAL SIGNAL OF SEMICONDUCTOR FABRICATING EQUIPMENT |
摘要 |
PURPOSE: A real-time information system of an abnormal signal of semiconductor fabricating equipment is provided to inform an engineer of the abnormal signal occurring from the semiconductor fabricating equipment in real time by automatically detecting whether the semiconductor fabricating equipment malfunctions or breaks down. CONSTITUTION: A signal conversion apparatus(10) converts an abnormal signal occurring in the semiconductor fabricating equipment into an electrical signal. A transmission apparatus(20) transmits the electrical signal. A display apparatus(30) in the outside of a semiconductor fabricating line receives the electrical signal from the transmission apparatus and displays the electrical signal.
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申请公布号 |
KR20040013511(A) |
申请公布日期 |
2004.02.14 |
申请号 |
KR20020046474 |
申请日期 |
2002.08.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, HYEON CHEOL |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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