发明名称 |
CAPACITIVE ELEMENT AND MANUFACTURING METHOD |
摘要 |
PURPOSE: To provide a capacitive element with a suppressed variation in composition of a ferroelectric thin film when the ferroelectric thin film is formed on a lower electrode of 100nm or smaller in a surface response rate controlling method containing a MOCVD method and to provide its manufacturing method. CONSTITUTION: A capacitive element includes a lower electrode 15, a ferroelectric thin film 16 and an upper electrode 17 on a substrate 11. The ferroelectric thin film 16 is formed in film formation in a response rate controlling method. The film thickness of the lower electrode 15 is 100 nm or smaller and a variation in film thickness of the lower electrode 15 is within 10%.
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申请公布号 |
KR20040014315(A) |
申请公布日期 |
2004.02.14 |
申请号 |
KR20030054462 |
申请日期 |
2003.08.06 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
FUJII EIJI;ITO TOYOJI |
分类号 |
H01L27/105;H01G4/08;H01G4/12;H01L21/02;H01L21/314;H01L21/316;H01L21/8246;(IPC1-7):H01L27/105 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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