发明名称 CAPACITIVE ELEMENT AND MANUFACTURING METHOD
摘要 PURPOSE: To provide a capacitive element with a suppressed variation in composition of a ferroelectric thin film when the ferroelectric thin film is formed on a lower electrode of 100nm or smaller in a surface response rate controlling method containing a MOCVD method and to provide its manufacturing method. CONSTITUTION: A capacitive element includes a lower electrode 15, a ferroelectric thin film 16 and an upper electrode 17 on a substrate 11. The ferroelectric thin film 16 is formed in film formation in a response rate controlling method. The film thickness of the lower electrode 15 is 100 nm or smaller and a variation in film thickness of the lower electrode 15 is within 10%.
申请公布号 KR20040014315(A) 申请公布日期 2004.02.14
申请号 KR20030054462 申请日期 2003.08.06
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 FUJII EIJI;ITO TOYOJI
分类号 H01L27/105;H01G4/08;H01G4/12;H01L21/02;H01L21/314;H01L21/316;H01L21/8246;(IPC1-7):H01L27/105 主分类号 H01L27/105
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