发明名称 |
LOAD LOCK CHAMBER PURGE SYSTEM |
摘要 |
PURPOSE: A load lock chamber purge system is provided to minimize the generation of particles by supplying the purging gas to the load lock chamber to remove residues and fumes of the load lock chamber in a wafer loading process or a wafer unloading process. CONSTITUTION: A load lock chamber purge system includes a pumping line(160), a venting line(170), and a purging line(190). The pumping line(160) is used for maintaining a state of vacuum within a load lock chamber. The venting line(170) is used for supplying the venting gas to the load lock chamber in order to control the internal pressure of the load lock chamber. The purging line(190) is used for supplying the purging gas to the load lock chamber in order to remove residues and fumes of the load lock chamber in a wafer loading process or a wafer unloading process.
|
申请公布号 |
KR20040014068(A) |
申请公布日期 |
2004.02.14 |
申请号 |
KR20020047237 |
申请日期 |
2002.08.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, SEONG SEOK |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|