| 摘要 |
PROBLEM TO BE SOLVED: To precisely conduct an acceptance determining measuring test for a semiconductor integrated circuit having a large number of output terminals to output multi-gradation output voltages, using inexpensive device constitution. SOLUTION: This semiconductor inspecting device 100 is provided with an output voltage inspecting means 50, data input means 101, 12 for generating a comparison voltage. The output voltage inspecting means 50 is provided with an inspected voltage input means 51, a DAC 16, a DAC 107, a high-level comparator 52, a low-level comparator 53, and a compared result output means 56. The high-level comparator 52 and the low-level comparator 53 constitute a comparison means for comparing an inspected voltage with the comparison voltage. COPYRIGHT: (C)2004,JPO
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