发明名称 Position measuring method, exposure method and system thereof, device production method
摘要 A position measuring method suppresses the influence of characteristics intrinsic to masks to improve the measurement accuracy of the mark position. A mask mark RM1 is positioned within an observation field of an observation system, and one of a plurality of fiducial marks FMa, FMb is selectively positioned within the observation field based on the characteristic of the mask mark RM1 with respect to an illumination beam, and the relative positional information of the mask mark RM1 and a fiducial mark WFM1 is obtained based on the observation results.
申请公布号 US2004027573(A1) 申请公布日期 2004.02.12
申请号 US20030433401 申请日期 2003.06.03
申请人 TAKAHASHI AKIRA 发明人 TAKAHASHI AKIRA
分类号 G03F9/00;(IPC1-7):G01B11/00 主分类号 G03F9/00
代理机构 代理人
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