| 摘要 |
An object is to provide a flaw detection apparatus which can simplify labor necessary for flaw detection, which can inspect all packaging containers, and which does not destroy packaging container during inspection. The flaw detection apparatus comprises an electrode disposed in a region surrounded by a packaging material (11) including a layer of an electrically-conductive material; a cutting member made of an electrically-conductive material and adapted to cut a predetermined portion of the packaging material (11); variable detection means, disposed between the electrode and the cutting member, for detecting an electrical variable; and flaw detection processing means for reading the variable and for detecting, on the basis of the variable, a flaw generated in the packaging material (11). In this case, the variable detection means is disposed between the electrode and the cutting member. An electrical variable is detected by the variable detection means, and a flaw generated in the packaging material (11) is detected on the basis of the electrical variable. Therefore, the labor for detecting a flaw generated in the packaging material (11) can be simplified.
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