| 摘要 |
The invention relates to a modular vacuum test adapter comprising a vacuum chamber and a wiring chamber. Said modular vacuum test adapter has no covering, is self-adjusting in terms of height, can be precisely contacted from above, and is used to test electronic switching groups. The inventive test adapter also comprises an integrated holding-down plate which uses ball-jointed guiding pins with a locking capacity. Vacuum test adapters use a seal or a vacuum covering to seal the test specimen. The aim of the novel method is to replace the use of an extra seal or extra covering entailing complex manual work and fine adjustment of holding-down clamps, and also to enable precise contacting from above. To this end, the test specimen (21) is positioned below the holding-down plate (11) and is pressed downwards by means of holding-down clamps (22) during the suction process. Two ball-jointed guiding pins (17,18) in the rear region and two guiding pins in the front region enable the holding-down plate (11) to be tilted upwards and the test specimen (21) to be inserted. The holding-down plate (11) operates inside the seal (19). The test specimen (21) can be precisely contacted from above by means of guiding pins (17). The holding-down plate (11) comprising holding-down clamps (22) pushes the test specimen (21) downwards during the suction process, until the test specimen (21) reaches the lower spacers (20). The modularity is achieved by inserting a plurality of plates (7). The invention further relates to the production of one such test adapter. |
