| 摘要 |
PROBLEM TO BE SOLVED: To provide a method wherein inferior devices which is likely to suddenly deteriorate and rapidly deteriorate can be surely sorted and removed in screening semiconductor laser devices. SOLUTION: The screening method comprises a first process of energizing a current for ten hours or longer at a temperature of 50°C or higher, a second process of sweeping the current to a maximum current value larger than that of the first current for the semiconductor laser device, after the first process and sorting from a lowering rate of an optical output at the current value, and a third process for measuring the optical output characteristics before and after the first process and removing inferior products by setting the measured result in accordance with a sorting standard. COPYRIGHT: (C)2004,JPO
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