发明名称 |
NONDESTRUCTIVE INSPECTION METHOD AND NONDESTRUCTIVE INSPECTION APPARATUS BY SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a nondestructive inspection method and a nondestructive inspection apparatus by a superconducting quantum interference device (SQUID) for specifying the location of occurrence of degradation by spatially measuring changes in the density of magnetic flux without contact and of observing the state of insulation through the use of the SQUID. SOLUTION: A prescribed voltage is impressed on electrodes 4 and 5 attached to insulating plastics 3 from an electric power source 6 for measurement. Changes in the density of a current generated by the impressing voltage are determined by making the SQUID sensor 1 scan. Image data in which a pair of the south pole and the north pole appears in a degraded part at right angles to the direction of current flow is processed by a measurement control PC 13 to inspect a degradating phenomenon of the insulating plastics 3. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004045143(A) |
申请公布日期 |
2004.02.12 |
申请号 |
JP20020201376 |
申请日期 |
2002.07.10 |
申请人 |
KANSAI ELECTRIC POWER CO INC:THE |
发明人 |
HATTORI OSAMU |
分类号 |
G01R33/035;G01N27/72;(IPC1-7):G01N27/72 |
主分类号 |
G01R33/035 |
代理机构 |
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地址 |
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