发明名称 Compact semiconductor structure and method for producing the same
摘要 The invention relates to a compact semiconductor structure comprising an insulation layer on a semiconductor substrate and at least two metallic conductor strips (7, 8) in said insulation layer. The invention aims to reduce the capacitive coupling between the neighbouring metallic conductor strips of a semiconductor structure and to enable the production of a more compact semiconductor structure. To achieve this, the inventive semiconductor device is characterised in that the insulation layer comprises a first insulation layer (1) of a predetermined thickness consisting of a first insulation material and a second insulation layer (10) of a predetermined thickness consisting of a second insulation material and located above the first insulation layer (1). The two or more metallic conductor strips (7, 8) extend from the first insulation layer (1) into the second insulation layer (10) and the second insulation material has a lower relative dielectric constant than the first insulation material.
申请公布号 US2004029374(A1) 申请公布日期 2004.02.12
申请号 US20030432770 申请日期 2003.09.26
申请人 HOHNSDORF FALKO;KIESLICH ALBRECHT;WEBER DETLEF 发明人 HOHNSDORF FALKO;KIESLICH ALBRECHT;WEBER DETLEF
分类号 H01L21/3205;H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/3205
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