发明名称 SELF-ALIGNED MRAM CONTACT AND METHOD OF FABRICATION
摘要 A method of forming self-aligned MRAM contact is disclosed. MRAM stacks including an upper of a conductive material are formed over portions of integraed circuitry. An insulating material is formed over the substrate, including the MRAM stacks with the upper layer of conductive material. The insulating material is subsequently chemically mechanically polished or etched, stopping on the upper layer of conductive material, to expose of the conductive material which are used to self-alinged MRAM contacts.
申请公布号 WO02075808(A3) 申请公布日期 2004.02.12
申请号 WO2002US07285 申请日期 2002.03.12
申请人 MICRON TECHNOLOGY, INC. 发明人 LEE, ROGER
分类号 H01L21/56 主分类号 H01L21/56
代理机构 代理人
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