发明名称 BATCH FURNACE
摘要 A system and method for isothermally distributing a temperature across a semiconductor device. A furnace assembly is provided, which includes a processing tube configured to removably receive a wafer carrier having a full compliment of semiconductor wafers. A heating assembly is provided which can include a heating element positioned to heat air or other gases allowed to enter the process tube. The furnace assembly and process tube are capable of being vertically raised and lowered into a position enclosing the heating assembly within the process tube. Once the heating assembly forms a seal with the process tube, the process tube is exhausted and purged of air. Gas is then allowed to flow into the process tube and exchange heat with the heating element. The heated gas circulates through the process tube to convectively change the temperature of the wafers.
申请公布号 WO2004013901(A2) 申请公布日期 2004.02.12
申请号 WO2003US23849 申请日期 2003.07.30
申请人 WAFERMASTERS, INC. 发明人 YOO, WOO, SIK;FUKADA, TAKASHI
分类号 H01L21/205;C23C16/46;H01L21/00;H01L21/26;H01L21/324 主分类号 H01L21/205
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