| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that a checking time increases with the increase in storage capacity in the conventional checking method for writing/reading data to/from the whole storage areas and deciding whether the data are good or bad. SOLUTION: A semiconductor storage device is provided with a precharge control circuit 5 that can individually control the precharge of a plurality of particular bit lines and a determination circuits 8b, 8d, 8f and 8h for measuring and determining the level of bit lines 2b, 2d, 2f and 2h adjacent to bit lines 2a, 2c, 2e and 2g that are subjected to precharge. A plurality of bit lines are simultaneously precharged at testing and the determination circuit determines the level of the bit lines adjacent to the bit lines. This can determine a short circuit failure between adjacent bit lines. COPYRIGHT: (C)2004,JPO
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