发明名称 |
METHOD AND SYSTEM FOR MEASURING NOISE LEVEL OF ELECTRONIC OBJECT TO BE MEASURED |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and a system for determining a noise level of an electronic object to be measured by enabling the discrimination of the noise level even in a case wherein the object to be measured is of a high modulation type. SOLUTION: An apparatus for determining a loudness of the noise (T<SB>DUT</SB>) inputted to the object (2) is provided with a sinusoidal wave signal source (1) generating a sinusoidal wave signal (S<SB>in</SB>) to be inputted to the object (2) and a level meter (3) for measuring a voltage level of the object (2). The level meter (3) is provided with a sign wave power detector device (31) for capturing a sinusoidal wave power level (P<SB>SIN</SB>) and a noise power level detector device (32) for capturing a noise power level (P<SB>NOISE</SB>). COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004045403(A) |
申请公布日期 |
2004.02.12 |
申请号 |
JP20030184670 |
申请日期 |
2003.06.27 |
申请人 |
ROHDE & SCHWARZ GMBH & CO KG |
发明人 |
BOS HERMANN;SCHMIDT KURT;FREIDHOF MARKUS |
分类号 |
G01R29/26;(IPC1-7):G01R29/26 |
主分类号 |
G01R29/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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