| 摘要 |
A testing circuit for use in an inductive coupling system to test communication devices is disclosed. The testing circuit comprises at least an output transformer having a frequency response for providing a signal having electrical properties compatible with a communication device to be tested; and, a spectral shaping circuit having an input port for receiving a test signal and an output port for providing a shaped test signal, the shaped test signal for being provided via the at least an output transformer to a device under test, the spectral shaping circuit for partitioning the test signal in dependence upon pre-determined spectral ranges thereof and relating to a frequency response of at least an output transformer for shaping the frequency characteristics of the received signal in approximately inverse proportion to the frequency response of the at least an output transformer.
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