发明名称 |
Vertical field effect power transistor used as a trench gate DMOS transistor has source regions formed vertically to the surface of the silicon wafer by the polysilicon filling height of the trench |
摘要 |
Vertical field effect power transistor has source regions (6) formed vertically to the surface of the silicon wafer by the polysilicon filling height of the trench (4). The trench chamber is filled with insulating oxide so that it forms a surface with the surface of the wafer. An Independent claim is also included for a process for the production of a vertical field effect power transistor.
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申请公布号 |
DE10235074(A1) |
申请公布日期 |
2004.02.12 |
申请号 |
DE20021035074 |
申请日期 |
2002.07.31 |
申请人 |
X-FAB SEMICONDUCTOR FOUNDRIES AG |
发明人 |
LERNER, RALF |
分类号 |
H01L21/228;H01L21/265;H01L21/336;H01L29/08;H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/228 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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