发明名称 |
FABRICATION METHOD OF UBM BY ELECTROPLATING FOR FLIP CHIP INTERCONNECTIONS |
摘要 |
PURPOSE: A fabrication method of UBM(under bump metallurgy) by electroplating for flip chip interconnections is provided to be capable of reducing fabrication cost and improving the reliability of the UBM. CONSTITUTION: A wafer having a predetermined pattern is dipped in a plating solution. At this time, the plating solution contains nickel ion supply source and copper ion supply source. The first copper layer(15) is formed at the upper portion of a pad(12) of a chip(11) by applying predetermined current density. A nickel-copper alloyed layer(16) is formed at the upper portion of the first copper layer as a diffusion barrier between a solder bump and the pad by increasing the current density. Preferably, the second copper layer(17) is formed at the upper portion of the nickel-copper alloyed layer by reducing the current density. |
申请公布号 |
KR20040011628(A) |
申请公布日期 |
2004.02.11 |
申请号 |
KR20020044442 |
申请日期 |
2002.07.27 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KIM, JONG YEON;KIM, SU HYEON;YOO, JIN |
分类号 |
C25D5/12;C25D5/18;C25D7/12;H01L21/288;H01L21/60;H01L23/485;(IPC1-7):H01L21/60 |
主分类号 |
C25D5/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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