发明名称 EXHAUST MONITORING SYSTEM OF SEMICONDUCTOR EQUIPMENT AND METHOD FOR MONITORING THE SAME
摘要 PURPOSE: An exhaust monitoring system of semiconductor equipment and a method for monitoring the same are provided to be capable of monitoring exhaust in real time. CONSTITUTION: An analog signal is generated after measuring exhaust pressure(S10). The analog signal is converted into corresponding digital data(S20). Whether the exhaust pressure is off from a reference exhaust pressure extent, or not, is decided according to the digital data(S30). When the exhaust pressure is off from the reference exhaust pressure extent, an interlock signal is generated(S40). Preferably, an alarm is generated after the interlock signal(S50) is generated. Preferably, an equipment abnormality message is displayed after the interlock signal(S60) is generated.
申请公布号 KR20040012235(A) 申请公布日期 2004.02.11
申请号 KR20020045682 申请日期 2002.08.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, SANG HUN;LEE, IN SEOK;PARK, GI HWAN
分类号 H01L21/02;(IPC1-7):H01L21/02 主分类号 H01L21/02
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