发明名称 Nonvolatile semiconductor memory cell with electron-trapping erase state and methods for operating the same
摘要 A preferred embodiment of the invention provides a trapping nonvolatile memory cell comprising a P type semiconductor substrate with a N+ source and a N+ drain being formed on the semiconductor substrate, a channel being formed between the source and the drain. A first isolating layer, a nonconducting charge trapping layer, a second isolating layer and a gate are sequentially formed above the channel. The trapping layer stores an amount of electrons as the nonvolatile memory cell is erased.
申请公布号 US6690601(B2) 申请公布日期 2004.02.10
申请号 US20020113356 申请日期 2002.03.29
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 YEH CHIH-CHIEH;TSAI WEN-JER;LU TAO-CHENG
分类号 G11C16/04;H01L21/28;H01L29/792;(IPC1-7):G11C16/00 主分类号 G11C16/04
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