发明名称 |
Nonvolatile semiconductor memory cell with electron-trapping erase state and methods for operating the same |
摘要 |
A preferred embodiment of the invention provides a trapping nonvolatile memory cell comprising a P type semiconductor substrate with a N+ source and a N+ drain being formed on the semiconductor substrate, a channel being formed between the source and the drain. A first isolating layer, a nonconducting charge trapping layer, a second isolating layer and a gate are sequentially formed above the channel. The trapping layer stores an amount of electrons as the nonvolatile memory cell is erased.
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申请公布号 |
US6690601(B2) |
申请公布日期 |
2004.02.10 |
申请号 |
US20020113356 |
申请日期 |
2002.03.29 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
YEH CHIH-CHIEH;TSAI WEN-JER;LU TAO-CHENG |
分类号 |
G11C16/04;H01L21/28;H01L29/792;(IPC1-7):G11C16/00 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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