| 摘要 |
In a semiconductor laser element: an n-type cladding layer, an undoped or n-type optical waveguide layer, an Inx3Ga1-x3As1-y3Py3 quantum-well active layer, and an undoped or p-type optical waveguide layer are formed on an n-type GaAs substrate; a first etching stop layer and an n-type first current confinement layer are formed corresponding to high-refractive-index regions realizing an ARROW structure; a second etching stop layer and an n-type second current confinement layer are formed with an opening for current injection; and a p-type cladding layer and a p-type GaAs contact layer are formed over the entire upper surface. For example, the compositions of the cladding layers, the optical waveguide layers, the first etching stop layer, the first current confinement layer, the second etching stop layer, and the second current confinement layer are In0.49Ga0.51P (or Alz1Ga1-z1As), GaAs, p-type Inx8Ga1-x8P, GaAs, n-type or p-type Inx8Ga1-x8P, and Alz1Ga1-z1As, respectively.
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