发明名称 Substrate-biased silicon diode for electrostatic discharge protection and fabrication method
摘要 An integrated circuit device that includes a semiconductor substrate, a well region formed inside the semiconductor substrate, a first isolation structure formed inside the well region, a second isolation structure formed inside the well region and spaced apart from the first isolation structure, a dielectric layer formed over the well region, and a layer of silicon, formed over the dielectric layer, including a p-type portion, an n-type portion and a center portion disposed between the p-type and n-type portions.
申请公布号 US6690065(B2) 申请公布日期 2004.02.10
申请号 US20000749377 申请日期 2000.12.28
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 CHANG CHYH-YIH;KER MING-DOU
分类号 H01L21/00;H01L27/02;H01L27/146;H01L31/0352;H01L31/062;H01L31/105;(IPC1-7):H01L23/62 主分类号 H01L21/00
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