发明名称 Apparatus for wafer rinse and clean and edge etching
摘要 An apparatus for and method of rinsing one side of a two-sided substrate and removing unwanted material from the substrate's edge and/or backside. One embodiment of the method is directed toward rinsing and cleaning a substrate having a front side upon which integrated circuits are to be formed and a backside. This embodiment includes dropping the substrate front side down onto a pool of rinsing liquid in a manner such that the front side of the substrate is in contact with the solution while the substrate is held in suspension by the surface tension of the solution liquid thereby preventing the backside of the substrate from sinking under an upper surface of the pool. Next, while the substrate is in suspension in said rinsing liquid, the substrate is secured by its edge with a first set of fingers and in some embodiments the substrate is subsequently spun. In another embodiment, a method of forming a copper layer on a front side of a substrate is disclosed. The method includes plating the copper layer over the front side of the substrate in a plating device and then transferring the substrate from the plating device to rinsing and cleaning station. At the rinsing and cleaning station, the substrate is dropped front side down onto a pool of rinsing liquid so that the surface tension of the liquid holds the substrate in suspension thereby preventing the backside of said substrate from sinking under an upper surface of the pool and then, while the substrate is suspended in the pool, it is secured with a first set of fingers.
申请公布号 US6689418(B2) 申请公布日期 2004.02.10
申请号 US20010922130 申请日期 2001.08.03
申请人 APPLIED MATERIALS INC. 发明人 OLGADO DONALD J. K.;TEPMAN AVI;MOK YEUK-FAI EDWIN;KHOLODENKO ARNOLD V.
分类号 B08B3/04;C11D7/08;C11D7/26;C11D11/00;H01L21/00;H01L21/687;(IPC1-7):B05D3/12 主分类号 B08B3/04
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