| 摘要 |
PURPOSE: A test method for an A/D converter and a semiconductor device are provided to conduct sufficiently the operating test of a high speed A/D converter. CONSTITUTION: An encoding section(101) detects a logic boundary of a thermometer code and produces a digital signal of a Gray code(G). A Gray to binary conversion section(104) converts the Gray code output from the encoding section(101) to a digital signal of a binary code(B). The encoding section(101) includes an error detection section(102) for detecting whether or not values of upper order bits and lower order bits of the Gray code(G) have a particular relationship to detect an error code included in the Gray code(G), and an error correction section(103) for correcting the error code detected by the error detection section(102).
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