发明名称 RISING AFTER CHEMICAL-MECHANICAL PLANARIZATION PROCESS APPLIED ON A WAFER
摘要 A wafer having a non-metallic surface material containing at least partly silicon is planarized by progressively introducing a rinsing solution on the wafer surface so that the chemical attack of the polishing of the wafer surface is controllably stopped before going beyond a desired planarization. Chemical-mechanical planarization on a wafer having a non-metallic surface material containing at least partly silicon, involves polishing the wafer surface using a polishing plate together with a polishing solution comprising a chemical agent for chemical attacking the surface and abrasive particles for mechanically attacking the surface; rinsing resulting residues; and final cleaning. The rinsing solution is progressively introduced on the wafer surface so that the chemical attack of the polishing step is controllably stopped before going beyond a desired planarization.
申请公布号 AU2003263399(A1) 申请公布日期 2004.02.09
申请号 AU20030263399 申请日期 2003.07.22
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES 发明人 LAURENT FILIPOZZI;FREDERIC METRAL
分类号 H01L21/304;B08B1/04;B24B;B24B1/00;B24B7/22;B24B37/04;B28D5/00;H01L21/02;H01L21/306 主分类号 H01L21/304
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