发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method capable of suppressing warp in an SOI wafer in a manufacturing process. SOLUTION: The oxidation of filling layers 8a is prevented from being oxidized in an LOCOS process for forming a 6th insulating layer 14a by coating the surfaces of the filling layers 8a for filling trenches formed in a semiconductor layer 3 of the SOI wafer with anti-oxidation layers 13a to suppress the warp of the SOI wafer. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004040007(A) |
申请公布日期 |
2004.02.05 |
申请号 |
JP20020198184 |
申请日期 |
2002.07.08 |
申请人 |
FUJI ELECTRIC HOLDINGS CO LTD |
发明人 |
HIRABAYASHI ATSUO |
分类号 |
H01L21/762;H01L21/02;H01L21/76;H01L27/08;H01L27/12;(IPC1-7):H01L27/12 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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