发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method capable of suppressing warp in an SOI wafer in a manufacturing process. SOLUTION: The oxidation of filling layers 8a is prevented from being oxidized in an LOCOS process for forming a 6th insulating layer 14a by coating the surfaces of the filling layers 8a for filling trenches formed in a semiconductor layer 3 of the SOI wafer with anti-oxidation layers 13a to suppress the warp of the SOI wafer. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004040007(A) 申请公布日期 2004.02.05
申请号 JP20020198184 申请日期 2002.07.08
申请人 FUJI ELECTRIC HOLDINGS CO LTD 发明人 HIRABAYASHI ATSUO
分类号 H01L21/762;H01L21/02;H01L21/76;H01L27/08;H01L27/12;(IPC1-7):H01L27/12 主分类号 H01L21/762
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