发明名称 ALD METHOD AND APPARATUS
摘要 A method and an apparatus for executing efficient and cost-effective Atomic Layer Deposition (ALD) at low temperatures are presented. ALD films such as oxides and nitrides are produced at low temperatures under controllable and mild oxidizing conditions over substrates and devices that are moisture- and oxygen-sensitive. ALD films, such as oxides, nitrides, semiconductors and metals, are efficiently and cost-effectively deposited from conventional metal precursors and activated nonmetal sources. Additionally, substrate preparation methods for optimized ALD are disclosed.
申请公布号 WO03076678(A3) 申请公布日期 2004.02.05
申请号 WO2003US07029 申请日期 2003.03.07
申请人 SUNDEW TECHNOLOGIES, LLC 发明人 SNEH, OFER
分类号 C23C16/02;C23C16/14;C23C16/30;C23C16/34;C23C16/40;C23C16/44;C23C16/455 主分类号 C23C16/02
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