发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR BACK-ELECTRET
摘要 PURPOSE: A method for manufacturing a semiconductor back-electret is provided to be capable of preventing characteristic deterioration caused by humidity, and reducing the loss of electric charges for improving charge efficiency. CONSTITUTION: A multilayer thin film is formed at the upper portion of a silicon wafer by repeatedly depositing silicon inorganic material using a CVD(Chemical Vapor Deposition)(S3). A Teflon thin film is formed at the upper portion of the multilayer thin film by carrying out a spin coating process(S4). A heat treatment is carried out at the resultant structure at a predetermined high temperature(S5). After the resultant structure is cut into a predetermined size, a charging process is carried out each predetermined size(S6,S7).
申请公布号 KR20040011242(A) 申请公布日期 2004.02.05
申请号 KR20020045014 申请日期 2002.07.30
申请人 BSE CO., LTD. 发明人 PARK, SEONG HO;SONG, CHEONG DAM
分类号 H01L29/84;(IPC1-7):H01L29/84 主分类号 H01L29/84
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