发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR BACK-ELECTRET |
摘要 |
PURPOSE: A method for manufacturing a semiconductor back-electret is provided to be capable of preventing characteristic deterioration caused by humidity, and reducing the loss of electric charges for improving charge efficiency. CONSTITUTION: A multilayer thin film is formed at the upper portion of a silicon wafer by repeatedly depositing silicon inorganic material using a CVD(Chemical Vapor Deposition)(S3). A Teflon thin film is formed at the upper portion of the multilayer thin film by carrying out a spin coating process(S4). A heat treatment is carried out at the resultant structure at a predetermined high temperature(S5). After the resultant structure is cut into a predetermined size, a charging process is carried out each predetermined size(S6,S7).
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申请公布号 |
KR20040011242(A) |
申请公布日期 |
2004.02.05 |
申请号 |
KR20020045014 |
申请日期 |
2002.07.30 |
申请人 |
BSE CO., LTD. |
发明人 |
PARK, SEONG HO;SONG, CHEONG DAM |
分类号 |
H01L29/84;(IPC1-7):H01L29/84 |
主分类号 |
H01L29/84 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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