发明名称 MANUFACTURING METHOD OF EPITAXIAL WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of epitaxial wafer whose high light emitting output and high speed response time are compatible with each other when used as a material for an LED. <P>SOLUTION: Temperature T of a gallium arsenide (GaAs) single crystal substrate is set to T1 and a homogeneous layer having the same composition as the single crystal substrate is epitaxially grown. The temperature T of the substrate is raised from T1 to T2 and in the state that T2 is maintained, a composition change layer GaAs<SB>1-x</SB>P<SB>x</SB>(x=0&rarr;0.17) is epitaxially grown. While the temperature T of the substrate is decreased from T2 to T3, a composition fixed layer GaAs<SB>1-x</SB>P<SB>x</SB>(x=0.17) is epitaxially grown to obtain the epitaxial wafer. Zinc is thermally diffused from the surface of the composition fixed layer of the obtained epitaxial wafer to form a p-conductive (p) layer. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004035314(A) 申请公布日期 2004.02.05
申请号 JP20020193850 申请日期 2002.07.02
申请人 MITSUBISHI CHEMICALS CORP 发明人 TETSUKA HIDEKI;SATO TADASHIGE
分类号 C30B29/40;H01L33/30 主分类号 C30B29/40
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