发明名称 OPTICAL SHAPE MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an optical shape measuring device based on multi-slit scheme which is strong against the optical defocus of an irradiation device in an irradiation device of a three-dimensional optical geometry measuring device. SOLUTION: The device is mainly comprised of an optical shape measuring device that is characterized by having an irradiation means for irradiating a dual density pattern light with different monotone intensity distribution with respect of a base line direction and a multi-slit pattern light with respect to the same base line direction, a photographing means for obtaining the light receiving amount and the light receiving position of a light reflected from a measured object respectively for the irradiated dual density pattern and the multi-slit pattern, and a shape calculating means for estimating each slit number of the multi-slit pattern from the light receiving ratio with respect to the dual density pattern and calculating the shape of the measured object on each slit from the slit number and the slit light receiving position. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004037272(A) 申请公布日期 2004.02.05
申请号 JP20020195128 申请日期 2002.07.03
申请人 RICOH CO LTD 发明人 OSAWA YASUHIRO
分类号 G01B11/25;G06T1/00;(IPC1-7):G01B11/25 主分类号 G01B11/25
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