发明名称 |
GaN SINGLE CRYSTAL SUBSTRATE, NITRIDE SEMICONDUCTOR EPITAXIAL SUBSTRATE, AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a GaN single crystal substrate capable of flattening the surface of an epitaxial layer and reducing crystal defects in the epitaxial layer, to provide a nitride compound semiconductor epitaxial substrate and to provide its manufacturing method. SOLUTION: Polished surface of the GaN single crystal substrate 11 is subjected to heat treatment at≥990°C and≤1,010°C substrate temperature in an atmosphere of a mixed gas containing at least a NH<SB>3</SB>gas and a plurality of holes 13 are formed on the surface. When a compound semiconductor layer 12 is epitaxially grown on the surface of the substrate 11 in an appropriate growing condition, the holes 13 on the surface of the substrate 11 are buried while propagation of through dislocation from the substrate 11 to the semiconductor layer 12 is suppressed and the surface of the substrate are flattened. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004035360(A) |
申请公布日期 |
2004.02.05 |
申请号 |
JP20020197548 |
申请日期 |
2002.07.05 |
申请人 |
SUMITOMO ELECTRIC IND LTD;INST OF MATERIALS RESEARCH & ENGINEERING |
发明人 |
UENO MASANORI;TAKASUKA EIRYO;SU-JIN CHUA;PEN CHEN |
分类号 |
C30B29/38;C30B25/18;C30B33/02;H01L21/205;(IPC1-7):C30B29/38 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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