发明名称 |
Vertical transistor memory cell comprises a substrate containing a trench, electrically insulated storage regions side walls of the trench, gates region arranged in the trench, and source/drain regions |
摘要 |
Vertical transistor memory cell comprises a substrate containing a trench, a first electrically insulated storage region (201a, 201b; 202a, 202b) on a first sidewall of the trench, a second electrically insulated storage region (201c, 201d; 202c, 202d) on a second sidewall of the trench, a first gate region arranged in the trench on a the first storage region, a second gate region coupled with the first gate region on the second storage region, two first source/drain regions, and two second source/drain regions. One of the first source/drain regions is coupled with a lower end section of one of the storage regions and one of second source/drain regions is coupled with an upper end section of one of the storage regions. An Independent claim is also included for: (a) memory cell arrangement containing several vertical memory cells integrated on and/or in a substrate; (b) production of a vertical memory cell; and (c) process for operating a vertical transistor memory cell.
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申请公布号 |
DE10231202(A1) |
申请公布日期 |
2004.02.05 |
申请号 |
DE20021031202 |
申请日期 |
2002.07.10 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
LANDGRAF, ERHARD;HOFMANN, FRANZ;LUYKEN, JOHANNES R.;SCHULZ, THOMAS |
分类号 |
H01L21/336;H01L21/8246;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115;H01L21/824 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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