发明名称 |
Method for fabricating a deep trench capacitor for dynamic memory cells |
摘要 |
A method for fabricating a deep trench capacitor for dynamic memory cells in which a trench is etched into the depth of a semiconductor substrate, and wherein the interior of the trench is provided with a doping and a dielectric and is filled with a conductive material as an inner electrode. The inner electrode and the dielectric are etched back within a collar region, and a collar is formed using a collar process comprising a collar oxide deposition and etching back of the collar oxide on the substrate surface and in the trench as far as the inner electrode, after which the inner electrode is completed by further steps of depositing and etching back conductive layers. Prior to the doping a masking layer is applied to the collar region of the trench, and this masking layer is removed again before the collar process. Before the dielectric is applied the surface of the lower regions of the trench outside the collar region a layer of grains of conductive material is applied.
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申请公布号 |
US2004023464(A1) |
申请公布日期 |
2004.02.05 |
申请号 |
US20030465488 |
申请日期 |
2003.06.19 |
申请人 |
TEMMLER DIETMAR;KRASEMANN ANKE |
发明人 |
TEMMLER DIETMAR;KRASEMANN ANKE |
分类号 |
H01L21/8242;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/8242 |
代理机构 |
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地址 |
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