发明名称 Illumination system particularly for microlithography
摘要 There is provided an illumination system for microlithography with wavelengths <=193 nm. The illumination system includes a primary light source, a first optical component, a second optical component, an image plane, and an exit pupil. The first optical component transforms the primary light source into a plurality of secondary light sources that are imaged by the second optical component in the exit pupil. The first optical component includes a first optical element having a plurality of first raster elements that are imaged into the image plane, producing a plurality of images being superimposed at least partially on a field in the image plane. The second optical component comprises a first optical system that includes at least a third field mirror with positive optical power and a second optical system that includes at least a second field mirror with positive optical power. The first optical system images the plurality of secondary light sources in a plane between the first optical system and the second optical system, forming a plurality of tertiary light sources, and the second optical system images the plurality of tertiary light sources in the exit pupil.
申请公布号 US2004022353(A1) 申请公布日期 2004.02.05
申请号 US20030381626 申请日期 2003.08.20
申请人 ANTONI MARTIN;SINGER WOLFGANG;WANGLER JOHANNES 发明人 ANTONI MARTIN;SINGER WOLFGANG;WANGLER JOHANNES
分类号 G03F7/20;G21K1/06;(IPC1-7):G21K5/00 主分类号 G03F7/20
代理机构 代理人
主权项
地址
您可能感兴趣的专利