发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To improve an operating breakdown voltage of a DMOS type high breakdown transistor. <P>SOLUTION: A body layer includes a first body layer 3 deeply formed by including a channel region CH between an n+-type source layer and an n-type first drain layer 4, and a second body layer 6 overhanging from the first body layer 3 to a region under the layer 4 and shallowly formed. Since the impurity concentration of the layer 6 can be set low irrespective of that of the layer 3, an electric field by a drain voltage can be alleviated in this part. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004039774(A) 申请公布日期 2004.02.05
申请号 JP20020192998 申请日期 2002.07.02
申请人 SANYO ELECTRIC CO LTD 发明人 NISHIBE EIJI;KIKUCHI SHUICHI;UEHARA MASABUMI;ANZAI KATSUYOSHI
分类号 H01L29/10;H01L29/78 主分类号 H01L29/10
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