发明名称 METHOD FOR ANALYZING PROBES CARRIER USING TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY WITH HALOGEN LABELING
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a probe carrier analyzing method for accurately analyzing the state of nucleic acid probes fixed to a probe carrier, for example, imaging their locations of arrangement and performing quantitative analysis. <P>SOLUTION: A large number of nucleic acid probe fixing areas are arranged on a carrier in a matrix shape to form the nucleic acid probe carrier. When analyzing the nucleic acid probe carrier by time-of-flight secondary ion mass spectrometry, the nucleic acid probes are labeled with halogen atoms, fragment ions containing the halogen atoms are detected, and the state of the nucleic acid probes on the carrier is analyzed. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004037083(A) 申请公布日期 2004.02.05
申请号 JP20020190010 申请日期 2002.06.28
申请人 CANON INC 发明人 OKAMOTO HISASHI;TAKASE HIROMITSU;HASHIMOTO HIROYUKI
分类号 G01N23/225;C12N15/09;G01N27/62;G01N33/483;G01N33/53;G01N33/58;G01N37/00;(IPC1-7):G01N23/225 主分类号 G01N23/225
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