发明名称 Alignment methods for imprint lithography
摘要 Described are methods for patterning a substrate by imprint lithography. Imprint lithography is a process in which a liquid is dispensed onto a substrate. A template is brought into contact with the liquid and the liquid is cured. The cured liquid includes an imprint of any patterns formed in the template. Alignment of the template with the substrate is performed prior to curing the liquid. Alignment of the template with the substrate includes rotational alignment of the template with respect to the substrate.
申请公布号 US2004021254(A1) 申请公布日期 2004.02.05
申请号 US20020210780 申请日期 2002.08.01
申请人 SREENIVASAN SIDLGATA V.;WATTS MICHAEL P.C.;CHOI BYUNG J.;VOISIN RONALD D. 发明人 SREENIVASAN SIDLGATA V.;WATTS MICHAEL P.C.;CHOI BYUNG J.;VOISIN RONALD D.
分类号 B29C35/08;B29C59/00;B29C59/02;G03F7/00;G03F9/00;(IPC1-7):B29C59/16;G01B15/00;H05B6/00 主分类号 B29C35/08
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