发明名称 Method, system and computer product for plaque characterization
摘要 A method for plaque characterization. The method comprises obtaining a first set of image data created in response to a first x-ray energy level and including a plurality of pixel elements. Each of the first pixel elements corresponds to a unique location in an object being scanned. The method further comprises obtaining a second set of image data created in response to a second x-ray energy level and including a plurality of second pixel elements. Each of the second pixel elements corresponds to one of the first pixel elements and the second x-ray energy level is higher than the first x-ray energy level. The method also comprises calculating a third set of image data in response to the first set of image data and the second set of image data. The calculating includes subtracting each second pixel element from the corresponding first pixel element.
申请公布号 US2004022359(A1) 申请公布日期 2004.02.05
申请号 US20020064621 申请日期 2002.07.31
申请人 ACHARYA KISHORE;GOPINATH PRIYA;LI JIANYING;OKERLUND DARIN;WALKER MATTHEW JOSEPH 发明人 ACHARYA KISHORE;GOPINATH PRIYA;LI JIANYING;OKERLUND DARIN;WALKER MATTHEW JOSEPH
分类号 A61B6/03;A61B6/00;G06T7/00;G06T11/00;H05G1/64;(IPC1-7):H05G1/64 主分类号 A61B6/03
代理机构 代理人
主权项
地址