发明名称 METHOD FOR ANALYZING NUCLEIC ACID CHIP BY TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an analytical method for easily and highly sensitively performing quantitative analysis and two-dimensional imaging by bringing a target nucleic acid into a hybridized state to a nucleic acid probe arranged on a nucleic acid chip in a matrix shape and simultaneously and clearly discriminating the nucleic acid probe from the target nucleic acid. <P>SOLUTION: A probe nucleic acid and the target nucleic acid are previously labeled with different labeling substances, for example, halogen atoms to form hybrids. Then the probe nucleic acid and the target nucleic acid are individually imaged, and quantitative analysis is performed on them via measurement on secondary ions caused by the different labeling substances labeling the probe nucleic acid and the target nucleic acid. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004037123(A) 申请公布日期 2004.02.05
申请号 JP20020191391 申请日期 2002.06.28
申请人 CANON INC 发明人 OKAMOTO HISASHI;TAKASE HIROMITSU;HASHIMOTO HIROYUKI
分类号 G01N23/225;C12N15/09;C12Q1/68;G01N27/62;G01N33/53;G01N37/00;(IPC1-7):G01N23/225 主分类号 G01N23/225
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