发明名称 Semiconductor device using low-k material as interlayer insulating film and its manufacture method
摘要 A semiconductor element is formed over a surface of a semiconductor substrate. A first insulating film is formed over the surface of the semiconductor substrate, the first insulating film covering the semiconductor element. A second insulating film is formed over the first insulating film, the second insulating film having a dielectric constant lower than that of the first insulating film. A first wiring pattern is formed over the second insulating film. A conductive connection member buried in the second and first insulating films electrically interconnects the first wiring pattern and semiconductor element.
申请公布号 US2004021224(A1) 申请公布日期 2004.02.05
申请号 US20030630716 申请日期 2003.07.31
申请人 FUJITSU LIMITED 发明人 FUKUYAMA SHUN-ICHI;OWADA TAMOTSU;INOUE HIROKO;SUGIMOTO KEN
分类号 H01L21/768;H01L23/31;H01L23/522;H01L23/532;(IPC1-7):H01L21/476;H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/768
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