发明名称 METHOD AND APPARATUS FOR INSPECTING IMAGE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and apparatus for inspecting an image, which can strictly evaluate the failure factor, even for a specimen in which the photographed image exhibits a pattern from its nature. <P>SOLUTION: The image of the specimen obtained by imaging the specimen is smoothed, using a spatial filter having a pattern similar to that of the specimen. Thus, the peak in the brightness distribution of a partial region in the image of the specimen having only the pattern of the specimen is made unchanged, and the peak in the brightness distribution of the partial region in which the pattern of the specimen overlaps with the failure factor is lowered by the averaging. The difference between the image of the specimen before the smoothing and the image of the specimen after the smoothing is then calculated, and the failure factor is extracted by performing a binarizing process. When the failure factor is thus extracted, it is then determined whether the specimen is good or bad, by evaluating the the failure factor. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004037399(A) 申请公布日期 2004.02.05
申请号 JP20020198027 申请日期 2002.07.05
申请人 PENTAX CORP 发明人 SUDO TOSHIYUKI;NAKANISHI TAICHI
分类号 G01N21/88;G01M11/00;G06T1/00;G06T3/00;G06T5/20 主分类号 G01N21/88
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