发明名称 WET PROCESSING METHOD FOR SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a processing method capable of reducing particles that stick to wafer surfaces. SOLUTION: In this wet processing method wherein semiconductor wafers W are immersed in a process liquid, the semiconductor wafers W are immersed with their surfaces W1 facing upward, with the wafers W inclined at 3-45°or 10-20°relative to the process liquid surface H. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004039859(A) 申请公布日期 2004.02.05
申请号 JP20020194853 申请日期 2002.07.03
申请人 SUMITOMO MITSUBISHI SILICON CORP 发明人 KAKIZONO YUICHI
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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