发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device which can remove contaminants (heavy metal) well even if heat treatment is performed for a semiconductor wafer in single wafer basis. SOLUTION: A semiconductor wafer 2 is arranged on a heater 1 by bringing the rear surface (an opposite surface of an element formation surface) of the semiconductor wafer 2 into contact with the heater 1. A cooling material 3 is arranged on the semiconductor wafer 2 by bringing the surface of the semiconductor wafer 2 into contact with the cooling material 3. Temperature gradient is formed in the thickness direction of the semiconductor wafer 2 by holding the semiconductor wafer 2 between the heater 1 and the cooling material 3 in this way. Furthermore, electric field is formed in the thickness direction of the semiconductor wafer 2 by applying a negative voltage to an electrode 4 and by applying a positive voltage to the electrode 5. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004039953(A) |
申请公布日期 |
2004.02.05 |
申请号 |
JP20020196945 |
申请日期 |
2002.07.05 |
申请人 |
RENESAS TECHNOLOGY CORP |
发明人 |
ARIE HIROYUKI;KAWAI NAOYUKI;ISOMAE SEIICHI;MATSUDA YASUSHI;SAITOU SHIGEAKI |
分类号 |
H01L21/8234;H01L21/322;H01L27/088;(IPC1-7):H01L21/322;H01L21/823 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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