发明名称 Pressure-contact type semiconductor device
摘要 Provided a pressure-contact type semiconductor device including: a plurality of semiconductor chips; a heat buffer plate provided on one surface side of the plural semiconductor chips; and a metal electrode plate provided on the heat buffer plate on a side opposite the plural semiconductor chips, a surface thereof at any position not facing the plural semiconductor chips on the heat buffer plate side having a region which alleviates elastic deformation of the heat buffer plate. Also provided is a pressure-contact type semiconductor device including: a plurality of semiconductor chips; a heat buffer plate provided on one surface side of the plural semiconductor chips; and a metal electrode plate provided on the heat buffer plate on a side opposite the plural semiconductor chips, a peripheral shape thereof extending beyond and thus being larger than a peripheral shape of the heat buffer plate.
申请公布号 US2004021149(A1) 申请公布日期 2004.02.05
申请号 US20030460414 申请日期 2003.06.13
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KITAZAWA HIDEAKI;HASEGAWA SHIGERU;HIYOSHI MICHIAKI
分类号 H01L25/10;H01L23/051;H01L23/36;H01L23/48;H01L25/07;(IPC1-7):H01L29/74;H01L31/111 主分类号 H01L25/10
代理机构 代理人
主权项
地址