摘要 |
PROBLEM TO BE SOLVED: To provide a measuring device using total reflex light by surface plasmon resonance, etc., for measuring a total reflex light state precisely while restricting a cost increase and complicating the instrument without being affected by environmental value such as ambient temperature. SOLUTION: In a sensor well unit 100, a temperature detecting means 51-54 are provided, the number of which is less than the number of wells 101 which are measuring simultaneously. In a temperature calculating means 21 in a signal processing part 20, a quadratic approximation curve is obtained from 4 measured points detected by the temperature detecting means 51-54, and pseudo-detected temperature of each well is obtained from the quadratic approximation curve. In a compensation means 22, each measured value S obtained by output of optical detecting means 17A-H is compensated into the compensated values S'. In a signal processing part 20, a state of decay of total reflection is detected based on the compensated value S'. COPYRIGHT: (C)2004,JPO
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