发明名称 NUCLEIC ACID CHIP SUBSTRATE, NUCLEIC ACID CHIP INSPECTION METHOD, AND MANUFACTURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide nucleic acid chips for being inspected on the 100 percent basis and to provide a nucleic acid chip inspecting method. <P>SOLUTION: On a substrate, a plurality of nucleic-acid-related substances are arranged on the surface of the substrate in a matrix shape to form what is called nucleic acid chips. A nucleic acid probe for inspection is formed at part on the substrate in this nucleic acid chip substrate. The nucleic acid probe for inspection is observed by an environmental scanning electron microscope. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004037112(A) 申请公布日期 2004.02.05
申请号 JP20020190998 申请日期 2002.06.28
申请人 CANON INC 发明人 NAKAMURA HISAMI
分类号 G01N23/225;C12M1/00;C12M1/34;C12N15/09;C12Q1/68;G01N33/53;G01N37/00;(IPC1-7):G01N33/53 主分类号 G01N23/225
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